Dynamic critical phenomena in two-dimensional fully frustrated Coulomb gas model with disorder |
| |
Authors: | Wei Zhang |
| |
Affiliation: | Department of Physics, Zhejiang University, Hangzhou 310027, China |
| |
Abstract: | The dynamic critical phenomena near depinning transition in two-dimensional fully frustrated square lattice Coulomb gas model with disorders was studied using Monte Carlo technique. The ground state of the model system with disorder σ=0.3 is a disordered state. The dependence of charge current density J on electric field E was investigated at low temperatures. The nonlinear J-E behavior near critical depinning field can be described by a scaling function proposed for three-dimensional flux line system [M.B. Luo, X. Hu, Phys. Rev. Lett. 98 (2007) 267002]. We evaluated critical exponents and found an Arrhenius creep motion for field region Ec/2<E<Ec. The scaling law of the depinning transition is also obtained from the scaling function. |
| |
Keywords: | 74.25.Qt 64.60.Ht 05.70.Ln |
本文献已被 ScienceDirect 等数据库收录! |