Photoelectrochemical etching of ZnS: Further evidence for non-uniform flow of charge carriers in Schottky barriers |
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Authors: | R. Tenne M. Shatkay |
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Affiliation: | (1) Department of Plastics Research, The Weizmann Institute of Science, 76100 Rehovot, Israel |
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Abstract: | It is shown that short photoelectrochemical etching of two kinds of ZnS crystals leads to a reduction in the surface recombination velocity as evidenced by their increased photocurrent. The unique surface morphology (>109 pits cm–2) revealed after photoetching supports the hypothesis that the charge flow within the space charge layer is highly nonuniform.Incumbent of Helen & Milton A. Kimmelman Career Development Chair in perpetuity established by Helen and Milton A. Kimmelman, New York, NY |
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Keywords: | 61.70.Jc 73.40.Mr 61.70.Tm |
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