The structure of monolayer SiO2 on Mo(1 1 2): A 2-D [Si-O-Si] network or isolated [SiO4] units? |
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Authors: | Mingshu Chen |
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Affiliation: | Department of Chemistry, Texas A & M University, 3255 TAMU, College Station, TX 77843, United States |
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Abstract: | In this letter, atomically resolved scanning tunneling microscopic (STM) images obtained from monolayer SiO2/Mo(1 1 2) are presented. The results are consistent with a previously proposed structural model of isolated [SiO4] units based on vibrational features observed by high-resolution electron energy loss spectroscopy (HREELS) and infrared reflection-absorption spectroscopy (IRAS), and oxygen species identified by ultra-violet photoemission spectroscopy (UPS). These results are inconsistent with a structural model that assumes a two-dimensional (2-D) [Si-O-Si] network. These data illustrate that a metal substrate, although coated with an oxide thin layer, can be directly imaged at the atomic-scale with STM. |
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Keywords: | Infrared reflection-absorption spectroscopy (IRAS) High-resolution electron energy loss spectroscopy (HREELS) Scanning tunneling microscopy (STM) Surface structure, morphology Silicon dioxide (SiO2) |
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