| Characterization of spectral hole depth in Tm^3＋ ：YAG within the cryogenic temperature range |
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| 引用本文： | 陈雷,马秀荣,王伟,张双根,穆宽林,王夏洋,张世宇.Characterization of spectral hole depth in Tm^3＋ ：YAG within the cryogenic temperature range[J].中国物理 B,2013(6):413-417. |
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| 作者姓名： | 陈雷 马秀荣 王伟 张双根 穆宽林 王夏洋 张世宇 |
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| 作者单位： | [1]Engineering Research Center on Communication Devices （Ministry of Education）, School of Computer and Communication Engineering, Tianfin University of Technology. Tianjin 300384, China [2]Tianjin Key Laboratory of Film Electronic and Communication Device, School of Electronic Information Engineering, Tianjin University of Technology, Tianjin 300384, China |
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| 基金项目： | Project supported by the National Natural Science Foundation of China （Grant No. 11004152） and the Science Fund of Tianjin Education Commission （Grant Nos. 20090715 and 20110704）. |
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| 摘 要： | In this paper, spectral hole depth dependence on temperature below 10 K in Tm^3＋ ：YAG crystal is investigated in detail. A novel model is proposed to analyze the temperature dependence on the spectral hole. By using the proposed model, we theoretically deduce the temperature dependence of spectral hole depth. The results are compared with experimental results and they are in good agreement. According to the theoretic results, the optimum temperature in experiment can be found.
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| 关 键 词： | phonon process spectral hole depth spectral hole width Tm^3＋ ：YAG |
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