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Angle-resolved photoemission study of CoSi2 nanofilms grown on Si(111) substrates
Authors:Hiroyuki Sasaki  Akinori Tanaka  Tazumi Nagasawa  Shoji Suzuki  Toshiro Nagase
Affiliation:a Department of Physics, Graduate School of Science, Tohoku University, Aoba-ku, Sendai 980-8578, Japan
b The Tohoku University Museum, Tohoku University, Aoba-ku, Sendai 980-8578, Japan
Abstract:We have carried out an angle-resolved photoemission study for CoSi2 nanofilms grown on the Si(111)-7×7 substrates. The surface of CoSi2(111) nanofilm changes from the bulk-truncated surface to the surface with additional Si-bilayer by annealing at higher temperature above 825 K. The angle-resolved photoemission spectra of the CoSi2 nanofilm annealed at 853 K show the spectral features originated from the surface resonance state on the CoSi2 surface terminated by Si-bilayer. From the detailed photoemission study, we discuss the surface electronic structure in CoSi2(111) nanofilms grown on Si(111) substrates.
Keywords:73.20.Dx   79.60.i   68.55.a   81.15.Hi
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