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25 nm resolution single molecular fluorescence imaging by scanning near-field optical/atomic force microscopy
Authors:JM Kim  T Ohtani
Institution:a Department of Food Engineering, National Food Research Institute, Kannondai, Tsukuba, Ibaraki 305-8642, Japan
b School of Bionics, Tokyo University of Technology, Katakura, Hachioji, Tokyo 192-0982, Japan
Abstract:High-resolution single molecular near-field fluorescence images were observed by scanning near-field optical/atomic force microscopy (SNOM/AFM). We modified the SNOM/AFM for both high-resolution fluorescence imaging and high-resolution topographic imaging. The imaged fluorophore, Alexa 532, is prepared with a poly-methyl-methacrylate (PMMA) film coating. A fluorescence resolution of 25 nm was obtained with a simultaneous topographic image of a flat surface. A sample prepared with a lower PMMA concentration exhibited a rough surface in the micro area. The results for the flat surface indicated that the fluorescence resolution is worst in the rough surface sample, that the maximum fluorescence intensities for the individual fluorophore are similar, and that the decay rate is faster. Thus, we concluded that the morphological effect is an important factor in fluorescence image resolution and the apparent lifetimes of the fluorescence molecules.
Keywords:Luminescence  Atomic force microscopy  Surface structure  morphology  roughness  and topography
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