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“Rotating” steps in Si(0 0 1) homoepitaxy
Authors:SN Filimonov  B Voigtländer
Institution:a Siberian Physical-Technical Institute, Tomsk State University, 634050 Tomsk, Russia
b Institut für Schichten und Grenzflächen ISG 3, Forschungszentrum Jülich, D-52425 Jülich, Germany
Abstract:Steps on Si(0 0 1) surfaces which are initially not aligned along the high symmetry directions of the dimer reconstruction are observed, by scanning tunneling microscopy, to “rotate” toward 1 1 0] directions during Si growth. This step “rotation” occurs due to a faceting of the step edges. A theoretical analysis of adatom incorporation into the steps shows that this kinetic instability may be caused by a suppressed mobility of the growing species along the SA step edge.
Keywords:Computer simulations  Models of surface kinetics  Molecular beam epitaxy  Scanning tunneling microscopy  Faceting
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