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Effects of capacitive coupling on the escape rate in intrinsic Josephson junction stacks |
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| Authors: | Tomio Koyama Masahiko Machida |
| Affiliation: | a Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan b Center for Promotion of Computational Science and Engineering, Japan Atomic Energy Institute, Tokyo 110-0015, Japan c JST-CREST, Kawaguchi 332-0012, Japan |
| Abstract: | We formulate a macroscopic quantum theory that can describe the macroscopic quantum tunneling (MQT) in intrinsic Josephson junctions (IJJs). The capacitively coupled IJJ model is quantized in terms of the canonical quantization method. The multi-junction effect for the MQT to the first resistive branch is clarified. It is shown that the escape rate is greatly enhanced by the capacitive coupling between junctions. |
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