Retardation characteristics and birefringence of a multiple-order crystalline quartz plate

A crystalline quartz plate of thickness 1.070 mm is calibrated between 370 and 794 nm. Throughout this spectral interval, the retardance varied by 32π and the plate introduced quarterwave retardance 16 times at different wavelengths. The birefringence (n_e−n_o) of crystalline quartz was calculated as a single quantity and varied from 0.00971 at 370 nm to 0.00891 at 794 nm. All measurements were carried out at 23°C.