快重离子辐照C60薄膜的强电子激发效应研究

利用能量为2.0GeV的¹³⁶Xe和2.7GeV的²³⁸U离子对C₆₀薄膜进行了辐照,并用傅立叶变换红外光谱、X射线衍射谱和拉曼散射技术分析了辐照过的C₆₀样品,在傅立叶变换红外光谱上,首次观察到一个位于670cm^－1处的,表征未知结构的新峰,研究了其强度随电子能损和辐照剂量的变化规律.分析结果表明,电子能量转移主导了C₆₀薄膜的损伤过程;而损伤的部分恢复是由强电子激发的退火效应引起的;另外,离子的速度在损伤的建立过程中也起了一定的作用

Strong Electronic Excitation Effect of Swift Heavy Ions on C60 Films

Strong electronic excitation effect of C 60 films induced by 2 0 GeV 136Xe and 2 7GeV 238U ions was investigated by means of Fourier transform infrared (FTIR), Raman Scattering and X-ray diffraction (XRD) spectroscopies. A new peak located at 670 cm -1, which corresponds to an unknown structure, was observed in the FTIR spectra of C 60 films irradiated for the first time. The variation in intensity of 670 cm -1 peak with electronic energy loss and irradiation dose were studied. The analysis results indicated that electronic energy transfer dominates the damage process of C 60 films. The partial recovery of the damage in irradiated C 60 films at middle electronic energy loss is attributed to an annealing effect of the strong electronic excitation. The ion velocity also plays a role in the process of the damage creation.