Study of transient thermal surface processes |
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| Authors: | J. Fischer, Q. Kong, T. Stehlin F. Trä ger |
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| Affiliation: | (1) Physikalisches Institut der Universität Heidelberg, Philosophenweg 12, D-6900 Heidelberg, Federal Republic of Germany |
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| Abstract: | ![]()
Summary The method of nanosecond time-resolved photothermal displacement spectroscopy in combination with time-resolved light reflectivity measurements has been used to study aluminum and stainless steel substrates with sputter deposited Au and Sn films. The results show, that this method can be used as a non-contacting surface thermometer. In addition, a strong correlation between signal decay and film thickness could be observed.
Untersuchung transienter thermischer Oberflächenprozesse |
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