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Spektrochemische Bestimmung von Silizium in AlxGa1–xAs und physikalische Eigenschaften der Kristalle
Authors:G. Kü  hn,L. Fischer,H. Neumann,R. Bindemann
Abstract:
A direct spectrochemical method for the quantitative determination of silicon in AlxGa1–xAs (x ≈ 0,8) crystals was elaborated. The results of the analysis of highly doped samples (1019 … 1020 cm−3) were discussed in connection with photoluminescence spectra and electrical measurements.
Keywords:
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