Spektrochemische Bestimmung von Silizium in AlxGa1–xAs und physikalische Eigenschaften der Kristalle |
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Authors: | G. Kü hn,L. Fischer,H. Neumann,R. Bindemann |
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Abstract: | A direct spectrochemical method for the quantitative determination of silicon in AlxGa1–xAs (x ≈ 0,8) crystals was elaborated. The results of the analysis of highly doped samples (1019 … 1020 cm−3) were discussed in connection with photoluminescence spectra and electrical measurements. |
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