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Auger-spectroscopy studies of the electronic structure of amorphous carbon films
Affiliation:1. University of Cambridge, Chemical Engineering & Biotechnology, New Museums Site, Pembroke Street, Cambridge, CB2 3RA, United Kingdom;2. George Washington University, Department of Chemistry, Corcoran Hall 725 21st St. NW, Washington, DC 20052, USA;3. Nanyang Technological University, School of Chemical and Biomedical Engineering, 62 Nanyang Drive, 637459, Singapore;1. Center for Combustion Energy, Tsinghua University, Beijing 100084, China;2. Key Laboratory for Thermal Science and Power Engineering of the Ministry of Education, Tsinghua University, Beijing 100084, China;3. Department of Mechanical and Aerospace Engineering, Princeton University, Princeton, NJ 08544, USA
Abstract:Information on the density of valence states (DOVS) of aC films has been determined by Auger spectroscopy. The films were prepared by magnetron sputtering of graphite and plasma decomposition of hydrocarbon gas. The relative contents of graphite-like and diamond-like components in aC have been determined by comparison of the area under the π-band of aC with that of graphite. The effect of annealing on the aC structure has benn studied.
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