Structure and morphology of nickel-alumina/silica solar thermal selective absorbers |
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| Authors: | T. Boströ m,S. Valizadeh,J. Jensen,E. Wä ckelgå rd |
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| Affiliation: | a Norut Northern Research Institute Narvik, P.O Box 250, 8504 Narvik, Norwayb Division of Solid State Physics, Department of Engineering Sciences, Uppsala University, P.O Box 534, SE-751 21 Uppsala, Swedenc Division of Thin Film Physics, Department of Physics, Chemistry and Biology - IFM, Linköping University, SE-581 83Linköping, Swedend Division of Inorganic Chemistry, Department of Materials Chemistry, Uppsala University, P.O Box 538, SE-751 21, Uppsala, Sweden |
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| Abstract: | ![]()
Nickel-alumina/silica thin film materials for the use in solar thermal absorbers have been investigated using Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and Elastic Recoil Detection Analysis (ERDA). The TEM images revealed that all layers have a very small thickness variation and that the layers are completely homogenous. High resolution images showed 5-10 nm (poly) crystalline nickel nano-particles. ERDA showed that both the silica and alumina compositions contain more oxygen than 2:1 and 3:2 respectively. SEM showed the surface morphology and characteristics of the top silica anti-reflection layer. Hybrid-silica has showed to generate a smoother surface with less cracking compared to pure silica. The final curing temperature revealed to be of importance for the formation of cracks and the surface morphology. |
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| Keywords: | Solar Absorber SEM TEM ERDA |
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