Mo/Si multilayers used for the EUV normal incidence solar telescope |
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| Authors: | LIU Zhen YANG Lin CHEN Bo CHEN Bin & CAO JianLin State Key Laboratory of Applied Optics Changchun Institute of Optics Fine Mechanics Physics Chinese Academy of Sciences Changchun China Graduate University of Chinese Academy of Sciences Beijing |
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| Affiliation: | LIU Zhen1,2,YANG Lin1,CHEN Bo1,CHEN Bin1 & CAO JianLin1 1 State Key Laboratory of Applied Optics,Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences,Changchun 130033,China,2 Graduate University of Chinese Academy of Sciences,Beijing 100039 |
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| Abstract: | This paper first reviews an EUV normal incidence solar telescope that we have developed in our lab. The telescope is composed of four EUV telescopes and the operation wavelengths are 13.0 nm, 17.1 nm, 19.5 nm, and 30.4 nm. These four wavelengths, fundamental to the research of the solar activity and the atmosphere dynamics, are always chosen by the EUV normal incidence solar telescope. In the EUV region, almost all materials have strong absorption, so optics used in this region must be coated by the multila... |
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| Keywords: | EUV solar telescope multilayer reflectivity thermal stability |
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