High-resolution magnetic measurements at surfaces with spin polarized electrons

Observing the spin polarization of emitted electrons reveals surface magnetic information. In particular, high resolving power is achieved in different respects: 1) Magnetic micrography with a lateral resolution of 50 nm in a scanning electron microscope; 2) Non-destructive magnetic depth profiling in the 5–50 Å range with secondary electron emission; 3) Element specific chemical resolution using Auger electron emission; 4) Time-resolved magnetization measurements with pulsed-laser photoemission in less than 10 ns. The state-of-the-art of these techniques is illustrated with specific examples of surface magnetism.