Quality assessments of electrochromic devices: the possible use of 1/<Emphasis Type="Italic">f</Emphasis> current noise |
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| Authors: | J Smulko A Azens L B Kish C G Granqvist |
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| Institution: | 1.Faculty of Electronics, Telecommunications and Informatics,Gdańsk University of Technology,Gdańsk,Poland;2.ChromoGenics Sweden AB,Uppsala,Sweden;3.Department of Electrical and Computer Engineering,Texas A&M University,College Station,USA;4.Department of Engineering Sciences, The ?ngstr?m Laboratory,Uppsala University,Uppsala,Sweden |
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| Abstract: | Electrochromic (EC) devices, capable of modulating their optical transmittance by charge insertion/extraction, were produced
by laminating films comprised of nanoporous W oxide and Ni–V oxide by a polymer electrolyte and having this three-layer stack
between transparent conducting In2O3:Sn films backed by polyester foils. 1/f noise in the current (I) was observed when the charged (colored) EC device was discharged via a resistor. The power spectral density S
i
at fixed frequency scaled as S
i
∼ I
2. Extended color/bleach cycling degraded the optical quality and homogeneity of the device and concomitantly increased the
1/f noise intensity. These initial data indicate that 1/f noise has a potential to serve as a quality measure for EC devices. |
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| Keywords: | Electrochromics 1/f noise Tungsten oxide Nickel oxide Durability |
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