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带有非吸收窗口的高性能InGaAs/AlGaAs量子阱激光二极管
引用本文:刘翠翠,林楠,马骁宇,井红旗,刘素平.带有非吸收窗口的高性能InGaAs/AlGaAs量子阱激光二极管[J].发光学报,2022(1):110-118.
作者姓名:刘翠翠  林楠  马骁宇  井红旗  刘素平
作者单位:中国原子能科学研究院核物理所;国防科技工业抗辐照应用技术创新中心;中国科学院半导体研究所光电子器件国家工程中心;中国科学院大学
基金项目:国家自然科学基金(11690044);国家重点研发计划(2018YFB1107300)资助项目。
摘    要:为了解决限制近红外单发射区InGaAs/AlGaAs量子阱半导体激光二极管失效阈值功率提升的腔面光学灾变损伤问题,研制了一种带有Si杂质诱导量子阱混杂非吸收窗口的新型激光二极管,并对其性能进行了测试分析。首先,对于带有非吸收窗口的二极管,在其谐振腔上方前后腔面附近的窗口区域覆盖50 nm Si/100 nm SiO2组合介质层,在远离腔面的增益区域覆盖50 nm Si/100 nm TiO2组合介质层,并采用875℃/90 s快速热处理工艺促进Si杂质扩散诱导量子阱混杂并去除非辐射复合中心。然后,基于相同外延结构、相同流片工艺制备了无非吸收窗口的激光二极管作对照组。测试结果显示,带有非吸收窗口的新型激光二极管平均峰值输出功率提升约33.6%,平均峰值输出电流提升约50.4%,腔面光学灾变损伤的发生概率和破坏程度均明显降低,且其阈值电流、斜率效率及半高全宽等特性也无任何退化。该研究证明,采用Si杂质诱导量子阱混杂技术制备的非吸收窗口,对近红外单发射区InGaAs/AlGaAs量子阱半导体激光二极管腔面光学灾变损伤有明显的抑制效果。

关 键 词:半导体激光二极管  腔面光学灾变损伤  量子阱混杂  非吸收窗口

High Performance InGaAs/AlGaAs Quantum Well Semiconductor Laser Diode with Non-absorption Window
LIU Cui-cui,LIN Nan,MA Xiao-yu,JING Hong-qi,LIU Su-ping.High Performance InGaAs/AlGaAs Quantum Well Semiconductor Laser Diode with Non-absorption Window[J].Chinese Journal of Luminescence,2022(1):110-118.
Authors:LIU Cui-cui  LIN Nan  MA Xiao-yu  JING Hong-qi  LIU Su-ping
Institution:(Institute of Nuclear Physics, China Institute of Atomic Energy, Beijing 102413, China;National Innovation Center of Radiation Application, Beijing 102413, China;National Engineering Research Center for Optoelectronic Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China;University of Chinese Academy of Sciences, Beijing 100049, China)
Abstract:In order to solve catastrophic optical mirror damage(COMD),the problem of limiting the output power of near-infrared single-emitting InGaAs/AlGaAs quantum well semiconductor laser diodes(LD),a new-typed LD with a non-absorption window(NAW)based on Si impurity induced quantum well intermixing(QWI)technology was designed and fabricated,and its performance is tested and analyzed.Firstly,for the diode with NAW,a 50 nm Si/100 nm SiO2 composite dielectric layer is covered in the window region near the front and rear cavity surfaces above the cavity,and a 50 nm Si/100 nm TiO2 composite dielectric layer is covered in the gain region far away from the cavity surface.A rapid thermal annealing(RTA)process of 875℃/90 s is used to promote Si impurity diffusion induces QWI and remove non-radiation recombination centers.Then,based on the same epitaxial structure and preparation process,the traditional LD without NAW is prepared as the control group.Finally,the test results show that the catastrophic failure threshold power and the catastrophic failure threshold current of the new LD with NAW increase about 33.6%and 50.4%,respectively,and the occurrence probability and damage degree of COMD of the new LD are significantly reduced.Moreover,there is no degradation of the characteristics of threshold current,slope efficiency and full width half maximum of the new LD.This study proves that the NAW prepared by Si impurity induced QWI technology has a significant suppression effect on the COMD of near-infrared single-emitting InGaAs/AlGaAs quantum well semiconductor LD.
Keywords:semiconductor lasers  catastrophic optical mirror damage  quantum well intermixing  non-absorption window
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