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The fluctuations of the overlap in the Hopfield model with finitely many patterns at the critical temperature
Authors:Barbara Gentz  Matthias Löwe
Affiliation:Departement Mathematik, ETH Zürich, ETH Zentrum, CH-8092 Zürich, Switzerland, CH
Fakult?t für Mathematik, Universit?t Bielefeld, Postfach 100131, D-33501 Bielefeld, Germany. e-mail: loewe@mathematik.uni-bielefeld.de, DE
Abstract:
We investigate the limiting fluctuations of the order parameter in the Hopfield model of spin glasses and neural networks with finitely many patterns at the critical temperature 1/β c = 1. At the critical temperature, the measure-valued random variables given by the distribution of the appropriately scaled order parameter under the Gibbs measure converge weakly towards a random measure which is non-Gaussian in the sense that it is not given by a Dirac measure concentrated in a Gaussian distribution. This remains true in the case of β = β N →β c = 1 as N→∞ provided β N converges to β c = 1 fast enough, i.e., at speed ?(1/). The limiting distribution is explicitly given by its (random) density. Received: 12 May 1998 / Revised version: 14 October 1998
Keywords:Mathematics Subject Classification (1991): 60F05   60K35 (primary)   82C32 (secondary)
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