Dispersion of the nonlinear refractive index in sapphire |
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Authors: | Major Arkady Yoshino Fumiyo Nikolakakos Irkalis Aitchison J Stewart Smith Peter W E |
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Affiliation: | Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto M5S 3G4, Canada. a.major@utoronto.ca |
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Abstract: | The nonlinear refractive index, n2, of sapphire was experimentally measured in the 550-1550-nm wavelength range by use of a picosecond Z-scan technique. It was found that in this spectral region the value of n2 decreases monotonically from approximately 3.3 x 10(-16) to approximately 2.8 x 10(-16) cm2/W. An empirical expression for the wavelength dependence of the nonlinear refractive index in the 270-1550-nm range was obtained. |
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