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Evaluation of the piezoelectric behaviour produced by a thick-film transducer using digital speckle pattern interferometry |
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| Authors: | Lucas P. Tendela Alejandro FedericoGuillermo H. Kaufmann |
| Affiliation: | a Instituto de Física Rosario (Consejo Nacional de Investigaciones Científicas y Técnicas - Universidad Nacional de Rosario), Blvd. 27 de Febrero 210 bis, S2000EZP Rosario, Argentina b Electrónica e Informática, Instituto Nacional de Tecnología Industrial, P.O. Box B1650WAB, B1650KNA San Martín, Argentina c Instituto de Física Rosario and Centro Internacional Franco Argentino de Ciencias de la Información y de Sistemas (Consejo Nacional de Investigaciones Científicas y Técnicas - Universidad Nacional de Rosario), Blvd. 27 de Febrero 210 bis, S2000EZP Rosario, Argentina |
| Abstract: | This paper presents an interferometric measurement of the out-of-plane deflections produced by a piezoelectric transducer, manufactured by thick-film deposition of a ceramic paste over an alumina substrate, when is subjected to a DC electric voltage. It is shown that a digital speckle pattern interferometer with an incorporated phase-shifting facility allows the measurement of nanometer displacements generated by the piezoelectric device. These measurements are used to evaluate the effective piezoelectric charge constant along the polarization direction (d33)eff that characterizes the thick-film transducer. |
| Keywords: | Digital speckle pattern interferometry Piezoelectric transducers Thick films Screen printed ceramics |
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