|
|||||
|
|
Effects of residual stress on the electrical properties in PbZr0.52Ti0.48O3 thin films |
|
| Authors: | Zhi Wu Jing Zhou Wen Chen Jie Shen Chun Lv |
| Institution: | 1. State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, School of Materials Science and Engineering, Wuhan University of Technology, Wuhan, 430070, People’s Republic of China |
| Abstract: | |
| Keywords: | |
| 本文献已被 SpringerLink 等数据库收录！ | |