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Structural and conductivity studies of CsKSO4Te(OH)6 and Rb1.25K0.75SO4Te(OH)6 materials
Authors:N Chabchoub  J Darriet
Institution:a Laboratoire de Physique Appliquée, Faculté des Sciences de Sfax, 3018 Sfax, Tunisie
b Institut de Chimie de la Matière Condensée de Bordeaux, ICMCB-CNRS, 33608 Pessac cedex, France
Abstract:The crystal structures of the title compounds were solved using the single-crystal X-ray diffraction technique. At room temperature CsKSO4Te(OH)6 was found to crystallize in the monoclinic system with Pn space group and lattice parameters: View the MathML source; View the MathML source; View the MathML source; β=106.53(2)°; View the MathML source; Z=4 and View the MathML source. The structural refinement has led to a reliability factor of R1=0.0284 (wR2=0.064) for 7577 independent reflections. Rb1.25K0.75SO4Te(OH)6 material possesses a monoclinic structure with space group P21/a and cell parameters: View the MathML source; View the MathML source; View the MathML source; β=106.860(10)°; View the MathML source; Z=4 and View the MathML source. The residuals are R1=0.0297 and wR2=0.0776 for 3336 independent reflections. The main interest of these structures is the presence of two different and independent anionic groups (TeO66− and SO42−) in the same crystal.Complex impedance measurements (Z*=ZiZ) have been undertaken in the frequency and temperature ranges 20-106 Hz and 400-600 K, respectively. The dielectric relaxation is studied in the complex modulus formalism M*.
Keywords:Sulfate tellurate  Crystal structure  X-ray diffraction  Modulus formalism
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