Structural and conductivity studies of CsKSO4Te(OH)6 and Rb1.25K0.75SO4Te(OH)6 materials |
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Authors: | N Chabchoub J Darriet |
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Institution: | a Laboratoire de Physique Appliquée, Faculté des Sciences de Sfax, 3018 Sfax, Tunisie b Institut de Chimie de la Matière Condensée de Bordeaux, ICMCB-CNRS, 33608 Pessac cedex, France |
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Abstract: | The crystal structures of the title compounds were solved using the single-crystal X-ray diffraction technique. At room temperature CsKSO4Te(OH)6 was found to crystallize in the monoclinic system with Pn space group and lattice parameters: ; ; ; β=106.53(2)°; ; Z=4 and . The structural refinement has led to a reliability factor of R1=0.0284 (wR2=0.064) for 7577 independent reflections. Rb1.25K0.75SO4Te(OH)6 material possesses a monoclinic structure with space group P21/a and cell parameters: ; ; ; β=106.860(10)°; ; Z=4 and . The residuals are R1=0.0297 and wR2=0.0776 for 3336 independent reflections. The main interest of these structures is the presence of two different and independent anionic groups (TeO66− and SO42−) in the same crystal.Complex impedance measurements (Z*=Z′—iZ″) have been undertaken in the frequency and temperature ranges 20-106 Hz and 400-600 K, respectively. The dielectric relaxation is studied in the complex modulus formalism M*. |
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Keywords: | Sulfate tellurate Crystal structure X-ray diffraction Modulus formalism |
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