Improved intensity-optimized dithering technique for 3D shape measurement |
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| Affiliation: | 1. Brookhaven National Laboratory—NSLS II, 50 Rutherford Dr. Upton, NY 11973-5000, USA;2. Jiangsu Key Laboratory of Spectral Imaging & Intelligence Sense, Nanjing University of Science and Technology, Nanjing 210094, China;3. College of Mechatronic Engineering and Automation, National University of Defense Technology, Changsha 410073, China;4. School of Mechanical and Aerospace Engineering, Nanyang Technological University, Singapore 639798, Singapore;1. Jiangsu Key Laboratory of Spectral Imaging & Intelligence Sense, Nanjing University of Science and Technology, Nanjing, Jiangsu Province 210094, China;2. Centre for Optical and Laser Engineering, School of Mechanical and Aerospace Engineering, Nanyang Technological University, 639798 Singapore;3. Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA 94720, USA;1. Smart Computational Imaging Laboratory (SCILab), Nanjing University of Science and Technology, Nanjing, Jiangsu Province 210094, China;2. Jiangsu Key Laboratory of Spectral Imaging & Intelligent Sense, Nanjing University of Science and Technology, Nanjing, Jiangsu Province 210094, China;1. Nanjing University of Science and Technology, School of Electronic and Optical Engineering, Xiaolingwei 200#, Nanjing 210094, China;2. Nanjing University of Science and Technology, Jiangsu Key Laboratory of Spectral Imaging & Intelligence Sense, Xiaolingwei 200#, Nanjing 210094, China;1. School of Electronic and Optical Engineering, Nanjing University of Science and Technology, No. 200 Xiaolingwei Street, Nanjing, Jiangsu Province 210094, China;2. Jiangsu Key Laboratory of Spectral Imaging and Intelligent Sense, Nanjing, Jiangsu Province 210094, China;3. Smart Computational Imaging Laboratory (SCILab), Nanjing University of Science and Technology, Nanjing, Jiangsu Province 210094, China;1. School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, 210094, China;2. Nanjing University of Science and Technology, Jiangsu Key Laboratory of Spectral Imaging & Intelligence Sense, Xiaolingwei 200#, Nanjing, 210094, China |
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| Abstract: | The recently proposed optimized dithering techniques are able to improve measurement quality obviously. However, those phase-based optimization methods are sensitive to the amount of defocusing while intensity-based optimization methods cannot reduce the phase error efficiently. This paper presents a novel method, minimizing a proposed objective function named intensity residual error (IRE), as well as a novel framework, optimizing pixels group by group, to construct binary patterns for high-quality 3D shape measurement. Both the simulation and experimental results show that this proposed algorithm can achieve phase quality improvements over other recently optimized dithering techniques with various amounts of defocusing. |
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| Keywords: | 3D shape measurement Fringe analysis Binary defocusing Dithering Optimization |
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