Refractive index sensors based on Ag-metalized nanolayer in microstructured optical fibers |
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Authors: | Wei Wei Xia Zhang Xin Guo Long Zheng Jing Gao Weipeng Shi Qi Wang Yongqing Huang Xiaomin Ren |
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Institution: | State Key Lab of Information Photonics and Optical Communications, Beijing University of Posts and Telecommunications, P.O. Box 66 (Room 741), Beijing 100876, China |
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Abstract: | We propose refractive index sensors based on Ag-metalized nanolayer in microstructured optical fibers. The surface plasmon resonance modes and the sensing properties are theoretically analyzed using finite element method (FEM). In the calculation, Drude–Lorentz model is used to describe the Metal Dielectric constant. The calculation results show that the sensitivity of Ag-metalized SPR sensor can reach 1500 nm/RIU corresponding to a resolution of 6.67 × 10?5 RIU. Comparing with conventional detecting material-Au under the same structure, the sensitivity and 3 dB bandwidth of our device are better. |
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