| 超导薄膜表面电阻测试方法及误差分析 |
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| 引用本文： | 张旭,周铁戈,孙冬艳,何明,方兰,阎少林.超导薄膜表面电阻测试方法及误差分析[J].低温物理学报,2005,27(1):605-609. |
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| 作者姓名： | 张旭 周铁戈 孙冬艳 何明 方兰 阎少林 |
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| 作者单位： | 南开大学电子科学系,天津300071 |
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| 基金项目： | 高等学校博士学科点专项科研基金和天津市光电子薄膜器件与技术重点实验室资助的课题. |
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| 摘 要： | 本文介绍一种蓝宝石加载单端短路谐振腔测量高温超导薄膜的方法，并对测量误差进行了较详细的分析．造成测量误差的主要因素有三个：系统无载品质因数Q0的测量误差，超导薄膜以外损耗品质因数Qother的实验误差，以及在谐振腔内超导薄膜的几何参数G的计算误差．大量的实验结果表明，本方法操作简便，重复性好，测量精度高，相对测量误差不超过10％．
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| 关 键 词： | 介质谐振腔 高温超导薄膜 微波表面电阻 |
| 收稿时间： | 04 1 2005 12:00AM |
SURFACE RESISTANCE MEASUREMENT METHOD AND ERROR ANALYSIS FOR HTS THIN FILMS |
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| ZHANG-XU,ZHOU TVIE-GE,SUN DONG-YAN,HE-MING,FANG-LAN,YAN SHAO-LIN.SURFACE RESISTANCE MEASUREMENT METHOD AND ERROR ANALYSIS FOR HTS THIN FILMS[J].Chinese Journal of Low Temperature Physics,2005,27(1):605-609. |
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| Authors: | ZHANG-XU ZHOU TVIE-GE SUN DONG-YAN HE-MING FANG-LAN YAN SHAO-LIN |
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| Institution: | Department of Electronics, Nankai University, Tianjin 300071 |
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| Abstract: | A new dielectric resonator method based on open-ended structure to measure the Rs alues of HTS films is introduced. The error in the Rs measurement mostly arises from the measurement of unloaded quality value Q0, calculation of geometrical factor G of the superconducting thin film in the resonator, and the measurement of Qother, contributed by the other losses except the HTS film. The experimental results show that the surface resistance measurement is accurate and convenient. The relative error of the measured Rs is less than 10%. |
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| Keywords: | dielectric resonator HTS thin films microwave surface resistance |
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