Resolving conflicting crystallographic and NMR models for solution-state DNA with solution X-ray diffraction |
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| Authors: | Zuo Xiaobing Tiede David M |
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| Institution: | Chemistry Division, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439, USA. |
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| Abstract: | We report on synchrotron-based high-angle X-ray solution scattering measured to 2 A resolution for two synthetic DNA sequences for which there are conflicting X-ray crystal and solution NMR models. Our results demonstrate that high-angle X-ray scattering discriminates between differing X-ray crystal and NMR models for solution-state DNA and provides a direct, independent method for testing structural models and measuring solution-state configurational dispersions. |
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