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Wavelet Signal Processing for Resolution Enhancement in a Recurrence Tracking Microscope |
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| Authors: | Naeem Akhtar Hayat Ullah Aiman al Omari Farhan Saif |
| Institution: | 1.Hefei National Laboratory for Physical Sciences Microscale University of Science and Technology of China Hefei,Anhui,China;2.Department of Electronics,Quaid-i-Azam University,Islamabad,Pakistan;3.Department of Physics,Jerash University,Jerash,Jordan;4.Department of Physics,Quaid-i-Azam University,Islamabad,Pakistan |
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| 本文献已被 SpringerLink 等数据库收录！ | |