| ICP—AES测定Ta中杂质元素 |
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| 引用本文： | 李帆 范健. ICP—AES测定Ta中杂质元素[J]. 光谱学与光谱分析, 1998, 18(4): 440-445 |
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| 作者姓名： | 李帆 范健 |
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| 作者单位： | 北京航空材料研究院分析化学研究室 |
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| 摘 要： | 本文研究了Ｔａ对Ａｌ、Ｃａ等十三种分析元素的干扰情况，列出了Ｔａ干扰其他分析元素的谱线，研究了操作条件变化时的非光谱干扰分布，对非光谱干扰采用优化操作条件的方法消除，并比较了校正光谱干扰的三种方法。
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| 关 键 词： | ICP AES 钽 杂质元素 干扰 铝 钙 测定 |
Determination of impurities in tantalum by ICP-AES] |
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| F Li,J Fan. Determination of impurities in tantalum by ICP-AES][J]. Spectroscopy and Spectral Analysis, 1998, 18(4): 440-445 |
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| Authors: | F Li J Fan |
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| Affiliation: | Analysis Chemistry Lab, Beijing Institute of Aeronautical Materials, 100095 Beijing. |
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| Abstract: | The spectral and non-spectral inteferences of tantalum to the determination of Al, Ca, Cr, Cu, Fe, Mg, Mn, Mo, Nb, Ni, Pb, Sn and Ti by ICP-AES were studied. The non-spectral inteference can be eliminated by optimizing operating conditions. Three methods for correction of spectral inteferences were evaluated. The proposed method was used for the determination of impurities in synthetic samples with satisfactory results. |
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