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Precise half-life measurement of the 26Si ground state |
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| Authors: | I. Matea J. Souin J. Äystö B. Blank P. Delahaye V. -V. Elomaa T. Eronen J. Giovinazzo U. Hager J. Hakala J. Huikari A. Jokinen A. Kankainen I. D. Moore J. -L. Pedroza S. Rahaman J. Rissanen J. Ronkainen A. Saastamoinen T. Sonoda C. Weber |
| Affiliation: | 1. Joint Institute for Nuclear Research, Dubna, Moscow Region, Russia 2. Federal State Scientific Institution “Nuclear Physics Institute”, Tomsk, Russia 3. Lebedev Physical Institute of the Russian Academy of Sciences, Moscow, Russia 4. Faculty of Fuels and Energy, AGH, University of Science and Technology, Cracow, Poland 5. Faculty of Physics and Applied Computer Sciences, AGH, University of Science and Technology, Cracow, Poland 6. Department of Physics and Astronomy, University of California, Irvine, CA, USA |
| Abstract: | The β-decay half-life of 26Si was measured with a relative precision of 1.4·10?3. The measurement yields a value of 2.2283(27) s which is in good agreement with previous measurements but has a precision that is better by a factor of 4. In the same experiment, we have also measured the non-analogue branching ratios and could determine the super-allowed one with a precision of 3%. The experiment was done at the Accelerator Laboratory of the University of Jyväskylä where we used the IGISOL technique with the JYFLTRAP facility to separate pure samples of 26Si. |
| Keywords: | PACS 21.10.-k Properties of nuclei nuclear energy levels 21.10.Tg Lifetimes, widths 23.40.Bw Weak-interaction and lepton (including neutrino) aspects 27.30.+t 20 ≤ A ≤ 38 |
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