Investigation on ion movement in the fringe-field switching mode depending on resistivity of alignment layer and dielectric anisotropic sign of liquid crystal |
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| Authors: | Dae Hyung Kim Jin Hyun Kim You Ri Kwon Anoop Kumar Srivastava |
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| Institution: | 1. Department of BIN Fusion Technology and Department of Polymer-Nano Science and Technology, Applied Materials Institute for BIN Convergence, Chonbuk National University, Jeonju, South Korea;2. Nanotechnology Application Centre, University of Allahabad, Allahabad, India |
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| Abstract: | Adsorption and desorption of ions at interface between liquid crystal and alignment layer in liquid crystal displays play a crucial role in residual direct current voltage associated with image sticking. In this article, the dependency of such adsorption and desorption of ions on resistivity of alignment layer and sign of liquid crystal dielectric anisotropy in the fringe-field liquid crystal cell has been investigated. Our studies show that the time constant of ions during adsorption and desorption depends upon resistivity and dielectric constant of liquid crystal and alignment layer, and most strongly influenced by the resistivity of alignment layer such that the one with lower resistivity in two orders shows much faster adsorption and desorption at the interface than that of the one with higher resistivity. |
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| Keywords: | fringe-field switching residual DC resistivity alignment layer |
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