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Beam profile measurement with CR-39 track detector for low-energy ions |
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| Authors: | F Sato Y Tanimura T Tanaka T Iida T Yamauchi K Oda |
| Institution: | a Department of Electronic, Information Systems and Energy Engineering, Osaka University, Yamada-oka, Suita-shi, Osaka 565, Japan b Department of Nuclear Engineering, Kobe University of Mercantile Marine, Fukaeminamimachi, Higashinada-ku, Kobe 658, Japan |
| Abstract: | A CR-39 track detector was successfully used to measure the outline of thin low-energy ion beams. After the etching, the surface of the detector was examined with an observation system composed of a Normarski microscope, a CCD camera and a digital image processing computer. Beam images obtained with the system were in good agreement on the outline of the beam formed with a beam aperture. Also, the resolving power in the beam outline measurement was roughly explained from the consideration of the ion range and the etch-pit growth in the chemical etching for the CR-39 detector. |
| Keywords: | Ion beam profile Low-energy ion CR-39 track detector Normarski differential interference contrast microscope Digital image processing |
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