X-Ray photoelectron valence band spectra from semiconductors Bi2Te3 and Sb2Te3

Angular resolved X-ray photoelectron spectra (ARXPS) are measured for valence bands of the layer semiconductors Bi₂Te₃ and Sb₂Te₃. Starting from simple models taking into consideration the atomic construction, photoionization cross sections and the crystal structure the spectra can be interpreted. Important conclusions are drawn on the electronic structure of these semiconducting compounds.