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Mn掺杂对ZnO薄膜结构及发光性能的影响
引用本文:陈香存,康朝阳,杨远俊,徐彭寿,潘国强.Mn掺杂对ZnO薄膜结构及发光性能的影响[J].发光学报,2011,32(12):1247-1250.
作者姓名:陈香存  康朝阳  杨远俊  徐彭寿  潘国强
作者单位:中国科学技术大学, 安徽 合肥 230029
基金项目:Supported by the National Natural Science Foundation of China(11079032)~~
摘    要:利用脉冲激光沉积的方法在Si衬底上生长出了c轴高度取向的Mn掺杂ZnO薄膜.X射线衍射表明所有样品都具有纤锌矿结构,没有发现其它相,随着掺杂量的增加,c轴晶格常数增大.原子力显微镜结果显示:Mn的掺杂引起了ZnO薄膜表面粗糙度的变化.由光致发光谱发现,在387 nm附近出现了由于近带边自由激子复合引起的紫外峰,还有以4...

关 键 词:X射线衍射  光致发光  ZnO薄膜  脉冲激光沉积
收稿时间:2011-06-22

Structural and Photoluminescence Analysis of Mn-doped ZnO thin Films
CHEN Xiang-cun,KANG Chao-yang,YANG Yuan-jun,XU Peng-shou,PAN Guo-qiang.Structural and Photoluminescence Analysis of Mn-doped ZnO thin Films[J].Chinese Journal of Luminescence,2011,32(12):1247-1250.
Authors:CHEN Xiang-cun  KANG Chao-yang  YANG Yuan-jun  XU Peng-shou  PAN Guo-qiang
Institution:National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China
Abstract:Zn1-xMnxO thin films were successfully grown on Si (111) substrates by pulsed laser deposition (PLD). X-ray diffraction measurement revealed that all the films were single phase and had wurtzite structure with c-axis orientation. As Mn concentration increased in Zn1-xMnxO films, the c-axis lattice constant increased gradually. Atomic Force Microscopy (AFM) showed that surface roughness and morphology changed with doping concentrations. Photoluminescence spectra of Zn1-xMnxO thin films were also studied which shows a narrow UV band at 387 nm, a broad blue band of 430 nm and another broad peak at 545 nm. It was deduced that Mn doping leads to a blue shift of the UV band, and a red shift of 430 nm and 545 nm.
Keywords:X-ray diffraction  photoluminescence  Mn-doped ZnO thin films  PLD
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