Piezoelectric non-linearity in PbSc0.5Ta0.5O3 thin films |
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Authors: | Anuj Chopra Yunseok Kim Marin Alexe Dietrich Hesse |
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Affiliation: | 1. Max Planck Institute of Microstructure Physics, Weinberg 2, D-06120 Halle (Saale), Germany;2. Faculty of Science and Technology, MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500 AE Enschede, The Netherlands;3. School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU), Suwon 440-746, Republic of Korea;4. Department of Physics, University of Warwick, Coventry CV4 7AL, UK |
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Abstract: | Epitaxial (001)-oriented PbSc0.5Ta0.5O3 (PST) thin films were deposited by pulsed laser deposition. Local piezoelectric investigations performed by piezoelectric force microscopy show a dual slope for the piezoelectric coefficient. A piezoelectric coefficient of 3 pm/V was observed at voltages up to 0.8 V. However, at voltages above 0.8 V, there is a steep increase in piezoelectric coefficient mounting to 23.2 pm/V. This nonlinear piezoelectric response was observed to be irreversible in nature. In order to better understand this nonlinear behavior, voltage dependent dielectric constant measurements were performed. These confirmed that the piezoelectric non-linearity is indeed a manifestation of a dielectric non-linearity. In contrast to classical ferroelectric systems, the observed dielectric non-linearity in this relaxor material cannot be explained by the Rayleigh model. Thus the dielectric non-linearity in the PST films is tentatively explained as a manifestation of a percolation of the polar nano regions. |
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Keywords: | A. Thin films B. Epitaxial growth D. Dielectric properties D. Ferroelectricity D. Piezoelectricity |
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