| AT&T准则下完全检验的最优设计 |
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| 引用本文： | 王强,谢琍.AT&T准则下完全检验的最优设计[J].数理统计与管理,2003,22(6):29-35. |
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| 作者姓名： | 王强 谢琍 |
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| 作者单位： | 1. 对外经济贸易大学国地贸易学院,北京,100029
2. 北京工业大学应用数理学院,北京,100022 |
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| 基金项目： | 本文获得对外经济贸易大学科研基金(02XJ017)资助 |
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| 摘 要： | 本文研究了完全检验的质量控制问题,将广泛用于X-控制图的AT&T准则应用于完全检验,并根据完全检验的特点,提出一种新的最优模型,数值实验结果表明AT&T准则下的完全检验优于传统的完全检验.
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| 关 键 词： | 完全检验 质量控制 X控制图 AT＆T准则 |
| 文章编号： | 1002-1566(2003)06-0029-07 |
| 修稿时间： | 2003年3月6日 |
Economic design of control charts with AT&T rules in complete inspection |
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| Abstract: | Duncan was the first to propose an economic model for the design of X- control charts. Since then, many other economic-based control charts have been developed. This includes the economic design of control plans for computerized automation processes. This paper studies the economic design of control charts with AT&T rules in the complete inspection context where every item is subject to variable inspection. The introduction of warning regions does not introduce new parameters in the design, but reduces loss for small shifts in the process mean. |
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| Keywords: | Quality control Complete inspection AT&T rules |
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