Dielectric relaxation and ac conduction of AgTlTe2 amorphous semiconductor

Measurements of the dielectric properties of AgTlTe₂ in the solid and liquid states were carried out in a wide range of frequencies and temperatures. The material shows dielectric dispersion. Cole-Cole diagrams have been used to determine the distribution parameter and the molecular relaxation time. The ac conduction mechanism and dielectric loss are attributed to correlated barrier hopping in the amorphous solid.