|
|||||
|
|
Temperature dependence of the dielectric strength of silicon monoxide films |
|
| Authors: | V. A. Mukhachev N. S. Mukhacheva |
| Affiliation: | (1) Tomsk Institute of Radio Electronics and Electronic Engineering, USSR |
| Abstract: | |
| Keywords: | |
| 本文献已被 SpringerLink 等数据库收录！ | |