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Growth and annealing effect of high-quality ZnSe:N/ZnSe by MOCVD
Authors:T Miki  J F Wang  A Omino  M Isshiki
Institution:

a Ricoh Research Institute of General Electronics, 5-10 Yokatakami, Kumanodo, Takadate, Natori 981-12, Japan

b Institute for Advanced Materials Processing, Tohoku University, 1-1, 2-Chome Katahira, Aobaku, Sendai 980-8577, Japan

c Mitsui Mining Company, Limited. 2-1-1, Nihombashi-muromachi, Chuo-ku, Tokyo 103-0022, Japan

Abstract:The ZnSe : N epitaxial layers were grown on (1 1 0) ZnSe substrates in a low-pressure metalorganic chemical vapor deposition (MOCVD) system using hydrogen as a carrier gas, and using ammonia as a dopant source. In order to obtain highly doped ZnSe : N epitaxial layers, the optimum growth and doping conditions were determined by studying the photoluminescence (PL) spectra from the ZnSe epitaxial layers grown at different ammonia flux and VI/II flux ratio. Furthermore, in order to enhance the concentration of active nitrogen in ZnSe epitaxial layer, a rapid thermal anneal technique was used for post-heat-treating. The results show that the annealing temperature of over 1023 K is necessary. Beside, a novel treatment method to obtain a smooth substrate surface for growing high quality ZnSe epitaxial layers is also described.
Keywords:ZnSe  MOCVD  Homoepitaxy  Nitrogen doping  Activation  Photoluminescence  Rapid thermal anneal
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