注入离子漂移管技术测量原子团簇结构

团簇结构测量是团簇科学研究中的一个重要课题。文章对近几年发展的注入离子漂移管技术进行了详细介绍与分析，该技术是上前测量团簇结构近似程度最高的技术，已在Ｃ，Ｓｉ，Ｇｅ及Ａｌ等原子团簇的结构研究中获得广泛应用，并取得了许多重要结果。

Injected Ion Drift Tube Technique for Measuring Atomic Cluster Structures

The recent developed injected ion drift tube technique,which can be used to assign particular cluster geometries or isomers,was described and analyzed. This technique has been applied to study the structural properties of carbon,silicon,germanium,and aluminium clusters. Some significant results were observed from these studies.