Lifetime measurements in 22Ne, 28Si and 31P relevant to the interpretation of the Z2 variation in low velocity DSAM results

Accurate lifetimes have been measured for low-lying levels in ²²Ne, ²⁸Si and ³¹P by bombarding ⁴He implanted targets with beams of ¹⁹F and ²⁸Si ions. Mean lifetimes determined by fitting Doppler-broadened γ-ray lineshapes were $\text{(E}{}_{\mathrm{<mtext>x</mtext>}}\text{in MeV}\text{, τ}\text{in ps}\text{):}{}^{22}\text{Ne}\text{(1.275, 5.15 ± 0.31; 3.357, 0.324 ± 0.009),}{}^{28}\text{Si}\text{(1.779, 0.667 ± 0.035),}{}^{31}\text{P}\text{(1.266, 0.70 ± 0.07; 2.234, 0.363 ± 0.024}$). The lifetime values for the 3.357 MeV level in ²²Ne and the 2.234 MeV level in ³¹P are used to calibrate low velocity DSAM lifetime data for these two levels and to obtain scaling factors to theoretical electronic stopping powers for Ne and P ions.