Thickness dependence of the maximum DC Josephson current in superconducting proximity junctions |
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Authors: | L. Van den Dries C. Van Haesendonck Y. Bruynseraede A. Gilbert |
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Affiliation: | Laboratorium voor Vaste Stof-Fysika en Magnetisme, K.U. Leuven, B-3030 Leuven, Belgium |
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Abstract: | We investigated the maximum dc Josephson current IM in NbNbxOyCu/Pb junctions as a function of normal layer thickness dCu. Theoretical calculations based on the McMillan proximity effect model are in good agreement with the experimental data. The monotonous decrease of RIM (R is the normal tunneling resistance) indicates the absence of any oscillatory behaviour or anomaly in the pair amplitude FCu(dCu) of the Cu/Pb sandwich, in contradiction with theoretical prediction. |
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