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Potential for size reduction of AlGaAs optical channel waveguide structures fabricated by focused ion beam implantation and oxidation
Authors:David H. Naghski   Joseph T. Boyd   Howard E. Jackson  Andrew J. Steckl
Affiliation:

a Department of Electrical and Computer Engineering and Computer Science, University of Cincinnati, Cincinnati, OH 45221-0030, USA

b Department of Physics, University of Cincinnati, Cincinnati, OH 45221-0011, USA

Abstract:
Optical channel waveguides formed by focused ion beam (FIB) implantation-induced mixing of AlGaAs multiple quantum well structures and subsequent oxidation of the mixed regions have the potential of significantly reducing the size of integrated photonic waveguide structures. Since FIB implantation is a direct write process characterized by nanoscale precision, we suggest its use for forming channel waveguides having nanoscale (submicrometer) widths. Calculations presented for such channel waveguides show reductions in size by at least an order of magnitude are possible for directional couplers and other structures involving curved channel waveguide sections. Such size reductions would allow the realization of significantly higher levels of device integration than are now currently possible.
Keywords:Optical waveguides   Communication channels (information theory)   Ion beam lithography   Ion implantation   Focusing   Oxidation   Semiconducting aluminum compounds   Semiconductor quantum wells   Computational methods   Integrated optics   Semiconductor superlattices   Optical channel waveguides   Integrated photonic waveguide structures
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