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Simple depolarizers for spectrophotometric measurements of anisotropic samples |
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| Authors: | M El Sherif MS Khalil S Khodeir N Nagib |
| Institution: | The authors are in the National Institute for Standards, PO Box 136 Giza, Code no. 12211, Giza, Egypt |
| Abstract: | Spectrophotometric measurements on optically anisotropic samples are considerably affected by the partial polarization of light in the instrument. It is shown that by depolarizing the incident beam, more realistic results are obtained even for strong directional anisotropic materials. Two types of depolarizers were investigated. |
| Keywords: | spectrophotometry polarization anisotropic materials |
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