Experimental evaluation of effective atomic number of composite materials using back-scattering of gamma photons |
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Authors: | Inderjeet Singh Bhajan Singh B S Sandhu |
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Institution: | Physics Department, Punjabi University, Patiala, India |
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Abstract: | A method has been presented for calculation of effective atomic number (Zeff) of composite materials, by using back-scattering of 662?keV gamma photons obtained from a 137Cs mono-energetic radioactive source. The present technique is a non-destructive approach, and is employed to evaluate Zeff of different composite materials, by interacting gamma photons with semi-infinite material in a back-scattering geometry, using a 3″?×?3″ NaI(Tl) scintillation detector. The present work is undertaken to study the effect of target thickness on intensity distribution of gamma photons which are multiply back-scattered from targets (pure elements) and composites (mixtures of different elements). The intensity of multiply back-scattered events increases with increasing target thickness and finally saturates. The saturation thickness for multiply back-scattered events is used to assign a number (Zeff) for multi-element materials. Response function of the 3″?×?3″ NaI(Tl) scintillation detector is applied on observed pulse-height distribution to include the contribution of partially absorbed photons. The reduced value of signal-to-noise ratio interprets the increase in multiply back-scattered data of a response corrected spectrum. Data obtained from Monte Carlo simulations and literature also support the present experimental results. |
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Keywords: | Effective atomic number multiple back-scattered intensity saturation thickness response function as inverse matrix Monte Carlo calculations signal-to-noise ratio |
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