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Morphology,surface roughness,electron inelastic and quasielastic scattering in elastic peak electron spectroscopy of polymers
Authors:B. Lesiak  A. Kosiński  R. Nowakowski  L. Kövér  J. Tóth  D. Varga  I. Cserny  A. Sulyok  G. Gergely
Affiliation:1. Institute of Physical Chemistry, Polish Academy of Sciences, Kasprzaka 44/52, 01‐224 Warszawa, PolandInstitute of Physical Chemistry, Polish Academy of Sciences, Kasprzaka 44/52, 01‐224 Warszawa, Poland.;2. Institute of Physical Chemistry, Polish Academy of Sciences, Kasprzaka 44/52, 01‐224 Warszawa, Poland;3. Institute of Nuclear Research of HAS, H‐4001 Debrecen, Hungary;4. Research Institute for Technical Physics and Materials Science of HAS, H‐1525 Budapest, Hungary
Abstract:
In elastic peak electron spectroscopy (EPES), the nearest vicinity of elastic peak in the low kinetic energy region reflects electron inelastic and quasielastic processes. Incident electrons produce surface excitations, inducing surface plasmons, with the corresponding loss peaks separated by 1–20 eV energy from the elastic peak. In this work, X‐ray photoelectron spectroscopy (XPS) and helium pycnometry are applied for determining surface atomic composition and bulk density, whereas atomic force microscopy (AFM) is applied for determining surface morphology and roughness. The component due to electron recoil on hydrogen atoms can be observed in EPES spectra for selected primary electron energies. Simulations of EPES predict a larger contribution of the hydrogen component than observed experimentally, where hydrogen deficiency is observed. Elastic peak intensity is influenced more strongly by surface morphology (roughness and porosity) than by surface excitations and quasielastic scattering of electrons by hydrogen atoms. Copyright © 2007 John Wiley & Sons, Ltd.
Keywords:surface morphology and roughness  electron inelastic and quasielastic scattering  elastic peak electron spectroscopy  polymers
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