Spatial determination of gold catalyst residue used in the production of ZnO nanowires by SIMS depth profiling analysis |
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| Authors: | R. J. H. Morris M. G. Dowsett S. H. Dalal D. L. Baptista K. B. K. Teo W. I. Milne |
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| Affiliation: | 1. University of Warwick, Physics Dept, Gibbet Hill Road, Coventry, CV4 7ALUniversity of Warwick, Physics Department, Gibbet Hill Road, Coventry, CV4 7AL.;2. University of Warwick, Physics Dept, Gibbet Hill Road, Coventry, CV4 7AL;3. University of Cambridge, Engineering Department, 9 JJ Thompson Avenue, Cambridge, CB3 0FA |
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| Abstract: | In this paper we demonstrate how secondary ion mass spectrometry (SIMS) can be applied to ZnO nanowire structures for gold catalyst residue determination. Gold plays a significant role in determining the structural properties of such nanowires, with the location of the gold after growth being a strong indicator of the growth mechanism. For the material investigated here, we find that the gold remains at the substrate–nanowire interface. This was not anticipated as the usual growth mechanism associated with catalyst growth is of a vapour–liquid–solid (VLS) type. The results presented here favour a vapour–solid (VS) growth mechanism instead. Copyright © 2007 John Wiley & Sons, Ltd. |
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| Keywords: | SIMS depth profiling nanowire growth ZnO |
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