Angle-resolved soft X-ray emission and absorption spectroscopy of hexagonal boron nitride |
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Authors: | Muramatsu Yasuji Kaneyoshi Takahiro Gullikson Eric M Perera Rupert C C |
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Affiliation: | Kansai Research Establishment, Japan Atomic Energy Research Institute (JAERI), 1-1-1 Kouto, Mikazuki, Sayo-gun, Hyogo 679-5148, Japan. murama@spring8.or.jp |
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Abstract: | ![]() Angle-resolved soft X-ray emission and absorption spectra in the BK and NK regions of hexagonal BN were measured using polarized synchrotron radiation. The take-off/incident-angle-dependence on the spectral features in both X-ray emission and absorption is clearly observed. The configuration of the sigma and pi orbitals, which were calculated using discrete variational (DV)-Xalpha molecular orbital calculations, explains the angle-resolved soft X-ray emission and absorption spectra. The relative peak intensity of the 394-eV peak in the NK X-ray emission provides useful information about the BN layer ordering. |
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