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Plasmonic refraction‐induced ultrahigh transparency of highly conducting metallic networks
Authors:Ruopeng Li  Qiang Peng  Bing Han  Yuanyu Ke  Xin Wang  Xubing Lu  Xueyuan Wu  Jiantao Kong  Zhifeng Ren  Eser Metin Akinoglu  Michael Giersig  Guofu Zhou  Jun‐Ming Liu  Krzysztof Kempa  Jinwei Gao
Abstract:We demonstrate a high optoelectronic performance and application potential of our random network, with subwavelength diameter, ultralong, and high‐quality silver nanowires, stabilized on a substrate with a UV binder. Our networks show very good optoelectronic properties, with the single best figure of merit of ~1686, and excellent stability under harsh mechanical strain, as well as thermal, and chemical challenge. Our network transparency strongly exceeds the simple shading limit. We show that this transmission enhancement is due to plasmonic refraction, which in an effective medium picture involves localized plasmons, and identify the inhomogeneous broadening as the key factor in promoting this mechanism. Such networks could become a basis for a next generation of ultrahigh‐performance transparent conductors.
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Keywords:metallic nanonetworks  discontinuous metallic films  silver nanowires  transparent conductors  plasmonic refraction
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