Structural and optical properties of CdS thin films |
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| Affiliation: | 1. Facultad de Metalurgia, Universidad Autónoma de Coahuila, Carr. 57, km. 5, C.P. 25720 Monclova, Coahuila, Mexico;2. Centro de Investigación en Materiales Avanzados, Monterrey, Nuevo León 66600, Mexico;3. Centro de Nanociencias y Micro y Nanotecnologías, Instituto Politécnico Nacional, México City 07738, Mexico;4. Centro de Investigaciones en Óptica, 37000 León, Guanajuato, Mexico;5. Department of Materials Science and Engineering, University of Texas at Dallas, Richardson, TX 75080, USA |
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| Abstract: | ![]()
CdS thin films are deposited onto glass substrates by vacuum evaporation at 373 K and the films are annealed at different temperatures. Rutherford backscattering spectrometry (RBS) and X-ray diffraction techniques are used to determine the thickness, composition, crystalline structure and grain size of the films. The films show a predominant hexagonal phase with small crystallites. The optical band gap of the films are estimated using the optical transmittance measurements. A decrease in the band gap is observed for the annealed films. The Raman peak position of the CdS A1 (LO) mode did not change much whereas, the full width at half maximum (FWHM) is found to decrease with annealing. |
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